Title: Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film mat
Description: Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also p
Keywords:
Scientific Computing International,
SCI,
film thickness,
thin film,
thin film thickness,
film thickness measurement,
metrology,
metrology tools,
thin film metrology,
thin film metrology tools,
ellipsometry,
ellipsometer,
ellipsometers,
spectroscopic ellipsometry,
spectroscopic ellipsometer,
SE,
multiwavelength ellipsometer,
reflectometry,
reflectometer,
reflectometers,
spectroscopic reflectometry,
spectroscopic reflectometer,
multi angle reflectometer,
material characterization,
optical properties,
thickness,
index,
index of refraction,
extinction coefficient,
material analysis,
roughness,
crystallinity,
spectrophotometry,
spectrophotometer,
duv spectroscopic ellipsometer,
NIR spectroscopic ellipsometer,
dispersion,
film software,
optical design,
low k,
porous silicon,
polysilicon,
si,
transmission,
reflection,
n and k,
optical coatings,
optical characterization,
optical spectroscopy,
spectrograph,
spectrometers,
thin film software,
optical design software,
material analysis software,
ellipsometry software,
optical monitor software,
retardance,
birefringence(
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